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Auger studies of chemical bonds and oxygen minimization in the interfaces between AlN and SiC thin films deposited by LPCVD

✍ Scribed by B. Aspar; R. Berjoan; C. Labatut; B. Armas


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
722 KB
Volume
81
Category
Article
ISSN
0169-4332

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