Auger profiling and electrical resistivity studies of the interface between evaporated AlCu layers: H S Wildman and G C Schwartz, J Vac Sci Technol, 20 (3), 1982, 396–399

• Book ID: 103467296
• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 175 KB
• Volume: 33
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(83)90782-0