𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Auger in-depth profiling of Mo–Si multilayers

✍ Scribed by Konkol, A.


Book ID
121648595
Publisher
AVS (American Vacuum Society)
Year
1994
Tongue
English
Weight
767 KB
Volume
12
Category
Article
ISSN
0734-2101

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


2504. Auger depth profiling of interface
📂 Article 📅 1977 🏛 Elsevier Science 🌐 English ⚖ 150 KB

conduction band potential obtained from the threshold measurements shows only a small deviation from a fiat band, less than • i 0.05 eV, tip to a point 4 A, from the silicon surface. There is no indication of a large ionic charge or of a greatly reduced SiO, bandgap to within about two lattice units

Auger depth profiling of BaTiO3 ceramics
✍ Prof. Dr. K. Berndt; Dipl. Phys. B. Rammelt; Dr. S. C. W. Heichler 📂 Article 📅 1990 🏛 John Wiley and Sons 🌐 English ⚖ 393 KB