Auger electron spectroscopy from elemental standards. I: Theoretical calculations
β Scribed by D. R. Batchelor; P. Rez; D. J. Fathers; J. A. Venables
- Publisher
- John Wiley and Sons
- Year
- 1988
- Tongue
- English
- Weight
- 783 KB
- Volume
- 13
- Category
- Article
- ISSN
- 0142-2421
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π SIMILAR VOLUMES
Ion bombardment usually leads to a change in the equilibrium sputtered surface composition of compound semiconductors. This change is matrix dependent. To compensate for this sputter-induced e β ect in quantitative AES, a sputter yield correction factor is usually employed. This factor is based on th
An analysis of the correlation of theoretical predictions for Auger electron intensities is made with the experimental data of the high-resolution digital Auger database. This analysis covers single-element samples measured for 5 keV and 10 keV beam energies. The spectral data are for wide scans of