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Auger electron spectrometer


Publisher
Elsevier Science
Year
1968
Tongue
English
Weight
466 KB
Volume
18
Category
Article
ISSN
0042-207X

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Evaluation of an Auger electron spectrom
✍ Fillmore, David K.; Krasinski, Harold A. πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 491 KB

Elemental and chemical microanalysis o †ered by Auger electron spectroscopy (AES) provides detailed elemental characterization of the typical Ðlms, particles and defects found in the ULSI regime. In this paper, an AES defect review tool (DRT) capable of accepting full 200 mm wafers is evaluated in a