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Auger-electron-photoion coincidence studies on ionic fragmentation following the Si 2p ionization of SiF4

✍ Scribed by E. Shigemasa; T. Hayaishi; K. Okuno; A. Danjo; K. Ueda; Y. Sato; A. Yagishita

Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
327 KB
Volume
79
Category
Article
ISSN
0368-2048

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Auger-electron-photoion coincidence study of SF6 excited by 196 eV photons shows that the dications having two holes in the outer-valence bands dissociate into various ionic fragments, while those having one hole in the outer-valence and one hole in the inner-valence (F 2s) bands mostly dissociate i