✦ LIBER ✦
Auger and X-ray photoelectron spectroscopic depth profiling techniques applied to ultra-thin titanium films
✍ Scribed by C.P. Lofton; W.E. Swartz Jr.
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 457 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0040-6090
No coin nor oath required. For personal study only.