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Auger analysis of impurity diffusion at the grain boundaries of silicon poly- and bicrystals

✍ Scribed by Jean-Paul Deville; Jean Quesada

Publisher
Elsevier Science
Year
1981
Tongue
English
Weight
89 KB
Volume
31
Category
Article
ISSN
0042-207X

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SIMS study of hydrogen at the surface an
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✍ B. Ladna; H.K. Birnbaum πŸ“‚ Article πŸ“… 1987 πŸ› Elsevier Science βš– 646 KB

The distribution of deuterium at the surface and at grain boundaries of cathodically charged nickel bicrystals was studied using Secondary Ion Mass Spectrometry. Both high energy and low energy boundaries were studied under conditions where deuteride formation occurred during charging. The formation