✦ LIBER ✦

Attenuation length determination of photoexcited electrons in copper

✍ Scribed by J.M. Seiller; S.S. Minn

Publisher: Elsevier Science
Year: 1974
Tongue: English
Weight: 283 KB
Volume: 15
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(74)90512-2

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Criticism of some hot-electron attenuati

Criticism of some hot-electron attenuation length measurements

✍ D.P. Oxley; R.E. Thurstans 📂 Article 📅 1975 🏛 Elsevier Science 🌐 English ⚖ 494 KB

Resonance scattering of photoexcited ele

Resonance scattering of photoexcited electrons in n-GaP

✍ Dang Ngoc Khanh; E. Goldys; M. Grynberg 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 342 KB

Anisotropy of electronic contribution to

Anisotropy of electronic contribution to the ultrasonic attenuation in copper

✍ R.E. Macfarlane; J.A. Rayne; C.K. Jones 📂 Article 📅 1965 🏛 Elsevier Science ⚖ 152 KB

Low energy (<3 eV) electron-attenuation

Low energy (<3 eV) electron-attenuation length in pentacene and perylene films

✍ Shojun Hino; Naoki Sato; Hiroo Inokuchi 📂 Article 📅 1976 🏛 Elsevier Science 🌐 English ⚖ 463 KB

Experimental determination of electron e

Experimental determination of electron effective attenuation lengths in silicon dioxide thin films using synchrotron radiation II. Effects of elastic scattering

✍ Shimada, H.; Matsubayashi, N.; Imamura, M.; Suzuki, M.; Higashi, Y.; Ando, H.; T 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 98 KB 👁 2 views

The effective attenuation lengths (EALs) of photoelectrons in thin silicon dioxide films on an Si(100) substrate were measured as a function of electron energy using synchrotron radiation as an energy-tunable excitation source. The ratios of EALs to inelastic mean free paths (IMFPs) calculated from

Experimental determination of electron e

Experimental determination of electron effective attenuation lengths in silicon dioxide thin films using synchrotron radiation I. Data analysis and comparisons

✍ Suzuki, M.; Ando, H.; Higashi, Y.; Takenaka, H.; Shimada, H.; Matsubayashi, N.; 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 266 KB 👁 2 views

We have measured effective attenuation lengths (EALs) of 140-1100 eV electrons in ultrathin silicon dioxide layers using synchrotron radiation. These EALs were generally smaller than those reported previously, although there was agreement with the values measured by Hochella and Carim (Surf. Sci. Le