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Attenuated phase shifting masks in combination with off-axis illumination: a way towards quarter micron DUV lithography for random logic applications

✍ Scribed by K. Ronse; R. Pforr; K.H. Baik; R. Jonckheere; L. Van den hove


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
610 KB
Volume
23
Category
Article
ISSN
0167-9317

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