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Atomistic study of grain boundary sink strength under prolonged electron irradiation

✍ Scribed by Yongfeng Zhang; Hanchen Huang; Paul C. Millett; Michael Tonks; Dieter Wolf; Simon R. Phillpot

Book ID: 113731850
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 1005 KB
Volume: 422
Category: Article
ISSN: 0022-3115
DOI: 10.1016/j.jnucmat.2011.12.024

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