Atomistic structure of stacking faults in a commercial GaAs:Si wafer revealed by cross-sectional scanning tunneling microscopy

✍ Scribed by Y. Ohno; T. Taishi; I. Yonenaga; S. Takeda

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 654 KB
• Volume: 401-402
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/j.physb.2007.08.154