Atomistic Modeling of Optical Properties of Thin Films
β Scribed by P. Puschnig; C. Ambrosch-Draxl
- Publisher
- John Wiley and Sons
- Year
- 2006
- Tongue
- English
- Weight
- 168 KB
- Volume
- 8
- Category
- Article
- ISSN
- 1438-1656
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## Abstract Large scale atomistic simulations of model nanocrystalline materials are used to investigate the plastic deformation mechnisms active in interface dominated materials, with the view to understanding the origin of the related high strength seen in experiment. Results are presented detail