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Atomic structure and microtopography of interfaces between crystalline and amorphous phasees in tungsten

✍ Scribed by A. S. Bakai; I. M. Mikhailovskii; E. V. Sadanov; O. A. Velikodnaya; T. I. Mazilova


Book ID
110146419
Publisher
SP MAIK Nauka/Interperiodica
Year
1997
Tongue
English
Weight
186 KB
Volume
66
Category
Article
ISSN
0021-3640

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Properties of interfaces in amorphous/cr
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## Abstract To study recombination at the amorphous/crystalline Si (a‐Si:H/c‐Si) heterointerface, the amphoteric nature of silicon (Si) dangling bonds is taken into account. Modeling interface recombination measured on various test structures provides insight into the microscopic passivation mechan