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Atomic steps on Si{100} and step dynamics during sublimation studied by low-energy electron microscopy

✍ Scribed by M. Mundschau; E. Bauer; W. Telieps; W. Świeçh

Publisher: Elsevier Science
Year: 1989
Weight: 90 KB
Volume: 223
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(89)90893-1

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