Atomic-scale simulation of interface defect formation in the initial stages of thin film growth

✍ Scribed by M. Djafari Rouhani; A.M. Gué; M. Sahlaoui; D. Estève

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 295 KB
• Volume: 228
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(93)90626-z