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Atomic-scale characterization of silicon diffusion on carbon nanotubes

✍ Scribed by Hongyu Zhang; Xuejuan Zhang; Mingwen Zhao; Zhenhai Wang

Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
501 KB
Volume
43
Category
Article
ISSN
1386-9477

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Atomic force acoustic microscopy technique has been used to characterize structural and mechanical properties of a nanocomposite sample, obtained by incorporating single-walled carbon nanotubes (SWCNTs) into epoxy resin. The aim of the reported preliminary characterization is to investigate the reli