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Atomic Resolution Mapping Using Quantitative High-angle Annular Dark Field Scanning Transmission Electron Microscopy

✍ Scribed by Aert, S Van; Verbeeck, J; Bals, S; Erni, R; Dyck, D Van; Tendeloo, S Van


Book ID
120648419
Publisher
Cambridge University Press
Year
2009
Tongue
English
Weight
402 KB
Volume
15
Category
Article
ISSN
1431-9276

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