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Atomic resolution improvement by a new method using the second derivative of the intensity function of the reconstructed exit wave of electrons for a thin β-Si3N4 crystal

✍ Scribed by Hwang Su Kim


Book ID
113898511
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
522 KB
Volume
63
Category
Article
ISSN
1359-6462

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