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Atomic Level Characterization Based on Focus Modulation Electron Microscopy

✍ Scribed by Takai, Yoshizo ;Taya, Masaki ;Chikada, Hidekazu ;Kimura, Yoshihide

Publisher: Springer-Verlag
Year: 2006
Weight: 228 KB
Volume: 155
Category: Article
ISSN: 0344-838X
DOI: 10.1007/s00604-006-0501-5

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