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Atomic-level characterisation of the structure of amorphised GaAs utilising EXAFS measurements

✍ Scribed by M.C. Ridgway; C.J. Glover; G.J. Foran; K.M. Yu


Book ID
114170560
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
245 KB
Volume
147
Category
Article
ISSN
0168-583X

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