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Atomic force/tunneling microscope and its application to the study of dielectric breakdown of a diamond film on silicon

✍ Scribed by A. V. Ermakov; V. K. Adamchuk

Book ID: 110123905
Publisher: SP MAIK Nauka/Interperiodica
Year: 1999
Tongue: English
Weight: 319 KB
Volume: 25
Category: Article
ISSN: 1063-7850
DOI: 10.1134/1.1262422

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