Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

✍ Scribed by Greg Haugstad(auth.)

• Year: 2012
• Tongue: English
• Leaves: 481
• Category: Library

✦ Synopsis

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.

“Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”

Content:
Chapter 1 Overview of AFM (pages 1–32):
Chapter 2 Distance?Dependent Interactions (pages 33–90):
Chapter 3 Z?Dependent Force Measurements with AFM (pages 91–136):
Chapter 4 Topographic Imaging (pages 137–186):
Chapter 5 Probing Material Properties I: Phase Imaging (pages 187–257):
Chapter 6 Probing Material Properties II: Adhesive Nanomechanics and Mapping Distance?Dependent Interactions (pages 258–329):
Chapter 7 Probing Material Properties III: Lateral Force Methods (pages 330–378):
Chapter 8 Data Post?Processing and Statistical Analysis (pages 379–399):
Chapter 9 Advanced Dynamic Force Methods (pages 400–436):