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Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments

✍ Scribed by Hui Xie, Cagdas Onal, Stéphane Régnier, Metin Sitti (auth.)


Publisher
Springer-Verlag Berlin Heidelberg
Year
2012
Tongue
English
Leaves
349
Series
Springer Tracts in Advanced Robotics 71
Edition
1
Category
Library

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✦ Synopsis


The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.

There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education.

Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.

✦ Table of Contents


Front Matter....Pages -
Introduction....Pages 1-11
Descriptions and Challenges of AFM Based Nanorobotic Systems....Pages 13-29
Instrumentation Issues of an AFM Based Nanorobotic System....Pages 31-86
Nanomechanics of AFM Based Nanomanipulation....Pages 87-143
Teleoperation Based AFM Manipulation Control....Pages 145-235
Automated Control of AFM Based Nanomanipulation....Pages 237-311
Applications of AFM Based Nanorobotic Systems....Pages 313-342
Back Matter....Pages -

✦ Subjects


Robotics and Automation; Artificial Intelligence (incl. Robotics); Nanotechnology and Microengineering


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