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Atomic force microscopy and fourier transform infra-red studies of the influence of a highly oriented poly(tetrafluoroethylene) substrate on poly(ethylene terephthalate) overlayers

✍ Scribed by N.W. Hayes; G. Beamson; D.T. Clark; D.T. Clarke; D.S.-L. Law


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
573 KB
Volume
37
Category
Article
ISSN
0032-3861

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