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Atomic-force-microscope-compatible near-field scanning microwave microscope with separated excitation and sensing probes

✍ Scribed by Lai, K.; Ji, M. B.; Leindecker, N.; Kelly, M. A.; Shen, Z. X.


Book ID
111900342
Publisher
American Institute of Physics
Year
2007
Tongue
English
Weight
834 KB
Volume
78
Category
Article
ISSN
0034-6748

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