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Atomic diffusion in amorphous Gd-Fe thin films. (USA)

Publisher
Elsevier Science
Year
1980
Tongue
English
Weight
167 KB
Volume
30
Category
Article
ISSN
0042-207X

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Amorphous interfacial reaction layers are widely found in metal-silicon and metal-metal thin film systems and may be significant in themselves or in controlling the selection of crystalline reaction products. Such layers show a marked asymmetry in the diffusivities of their component species. For ea