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Atom-probe field-ion microscopy of GaAs and GaP

✍ Scribed by Ohno Youichi; Kuroda Tsukasa; Nakamura Shogo

Book ID: 118982244
Publisher: Elsevier Science
Year: 1978
Tongue: English
Weight: 900 KB
Volume: 75
Category: Article
ISSN: 0039-6028
DOI: 10.1016/0039-6028(78)90186-3

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