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Atom Probe Field-Ion Microscopy: 30 Years of Atomic-level Analysis

✍ Scribed by M.K Miller; M.G Burke

Book ID: 114341166
Publisher: Elsevier Science
Year: 2000
Tongue: English
Weight: 90 KB
Volume: 44
Category: Article
ISSN: 1044-5803
DOI: 10.1016/s1044-5803(99)00064-9

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