Methods for atom probe analysis of micro
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R Frykholm; B Jansson; H.-O Andrén
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Article
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2002
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Elsevier Science
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English
⚖ 530 KB
Methods to prepare needle-shaped specimens for atom probe field ion microscopy from near surface regions have been developed. The material used was a cemented carbide with a composition gradient towards the surface, but the method is equally applicable for other materials. The preparation technique