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Atom-chip-based generation of entanglement for quantum metrology

✍ Scribed by Riedel, Max F.; Böhi, Pascal; Li, Yun; Hänsch, Theodor W.; Sinatra, Alice; Treutlein, Philipp

Book ID: 109898863
Publisher: Nature Publishing Group
Year: 2010
Tongue: English
Weight: 385 KB
Volume: 464
Category: Article
ISSN: 0028-0836
DOI: 10.1038/nature08988

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