✦ LIBER ✦
Assessment of the performance of laser-based lateral-crystallization technology via analysis and modeling of polysilicon thin-film-transistor mobility
✍ Scribed by Voutsas, A.T.
- Book ID
- 114617113
- Publisher
- IEEE
- Year
- 2003
- Tongue
- English
- Weight
- 366 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0018-9383
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