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Assessment of random and systematic errors in microwave and submillimetre dielectric measurements

✍ Scribed by Afsar, M.N.; Chamberlain, J.; Chantry, G.W.; Finsy, R.; van Loon, R.

Book ID
119747904
Publisher
Institution of Electrical Engineers
Year
1977
Weight
401 KB
Volume
124
Category
Article
ISSN
0020-3270

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