Assessment of radiation exposure in dental cone-beam computerized tomography with the use of metal-oxide semiconductor field-effect transistor (MOSFET) dosimeters and Monte Carlo simulations

✍ Scribed by J. Koivisto; T. Kiljunen; M. Tapiovaara; J. Wolff; M. Kortesniemi

• Book ID: 119335852
• Publisher: Elsevier
• Year: 2012
• Tongue: English
• Weight: 876 KB
• Volume: 114
• Category: Article
• ISSN: 2212-4403
• DOI: 10.1016/j.oooo.2012.06.003