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Assessment of pulse height defect in passivated implanted planar Si detectors used for channeling measurements with slow, highly charged heavy projectiles

✍ Scribed by J.D. Meyer; S. Biri; F. Ditrói; O. Hohn; S. Runkel; K. Stiebing


Book ID
114165533
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
173 KB
Volume
190
Category
Article
ISSN
0168-583X

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