Assessment of flatness and symmetry of megavoltage x-ray beam with an electronic portal imaging device (EPID)

✍ Scribed by G. Liu; T. van Doorn; E. Bezak

• Book ID: 105725615
• Publisher: Springer Netherlands
• Year: 2002
• Tongue: English
• Weight: 161 KB
• Volume: 25
• Category: Article
• ISSN: 0158-9938
• DOI: 10.1007/bf03178467