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Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films

✍ Scribed by Fujiwara, H.; Koh, Joohyun; Rovira, P. I.; Collins, R. W.


Book ID
120625018
Publisher
The American Physical Society
Year
2000
Tongue
English
Weight
252 KB
Volume
61
Category
Article
ISSN
1098-0121

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