✦ LIBER ✦
Assessing Charge Carrier Trapping in Silicon Nanowires Using Picosecond Conductivity Measurements
✍ Scribed by Ulbricht, Ronald; Kurstjens, Rufi; Bonn, Mischa
- Book ID
- 118152025
- Publisher
- American Chemical Society
- Year
- 2012
- Tongue
- English
- Weight
- 400 KB
- Volume
- 12
- Category
- Article
- ISSN
- 1530-6984
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