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[ASME ASME 2012 International Mechanical Engineering Congress and Exposition - Houston, Texas, USA (Friday 9 November 2012)] Volume 9: Micro- and Nano-Systems Engineering and Packaging, Parts A and B - Measurement of Thermal Conductivity and Interface Thermal Resistance of Multilayered Thin-Films Using Variable Pulse-Width Transient Thermoreflectance

✍ Scribed by Burzo, Mihai G.

Book ID: 121816128
Publisher: American Society of Mechanical Engineers
Year: 2012
Weight: 477 KB
Category: Article
ISBN: 0791845257
DOI: 10.1115/IMECE2012-88747

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