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Artificial neural network modeling for improved on-wafer OSLT calibration standards

✍ Scribed by Jeffrey A. Jargon; K. C. Gupta; Donald C. DeGroot

Publisher: John Wiley and Sons
Year: 2000
Tongue: English
Weight: 267 KB
Volume: 10
Category: Article
ISSN: 1096-4290
DOI: 10.1002/1099-047x(200009)10:5<319::aid-mmce7>3.0.co;2-5

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