Artifical neural network techniques for the estimation of thick-film resistance : B.G HOSKINS and M.R. HASKARD. Microelectronics Journal, 26, 9 (1995)

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 113 KB
• Volume: 36
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(96)84503-3