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ARIMA models used to predict the time to degradation failure of TTL ICs

โœ Scribed by M. I. Gorlov; A. V. Strogonov

Book ID
110214311
Publisher
Springer
Year
2007
Tongue
English
Weight
405 KB
Volume
36
Category
Article
ISSN
1063-7397

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Some life tests are terminated with few or no failures. In such cases, a recent approach is to obtain degradation measurements of product performance that may contain some useful information about product reliability. Generally degradation paths of products are modeled by a nonlinear regression mode