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ArF excimer laser deposited tin oxide films studied by “in situ” surface diagnostics and by synchrotron radiation induced UV photoemission

✍ Scribed by R. Larciprete; E. Borsella; P. De Padova; M. Fanfoni; M. Mangiantini; P. Perfetti


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
465 KB
Volume
69
Category
Article
ISSN
0169-4332

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