✦ LIBER ✦
Are Interface State Generation and Positive Oxide Charge Trapping Under Negative-Bias Temperature Stressing Correlated or Coupled?
✍ Scribed by Ho, T.J.J.; Ang, D.S.; Boo, A.A.; Teo, Z.Q.; Leong, K.C.
- Book ID
- 114620899
- Publisher
- IEEE
- Year
- 2012
- Tongue
- English
- Weight
- 848 KB
- Volume
- 59
- Category
- Article
- ISSN
- 0018-9383
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