Are electrical properties of an aluminum–porous silicon junction governed by dangling bonds?

✍ Scribed by Stievenard, D.; Deresmes, D.

• Book ID: 120344332
• Publisher: American Institute of Physics
• Year: 1995
• Tongue: English
• Weight: 336 KB
• Volume: 67
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.114942