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Approximation of crystallite size and microstrain via XRD line broadening analysis in TiSiN thin films

✍ Scribed by A.R. Bushroa; R.G. Rahbari; H.H. Masjuki; M.R. Muhamad


Book ID
113940929
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
870 KB
Volume
86
Category
Article
ISSN
0042-207X

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