Approximate tolerance limits and confidence limits on reliability for the Gamma distribution : Lee J. Bain, Max Engelhardt and Wei-Kei Shiue. IEEE Trans. Reliab. R-33, 184 (1984)

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 134 KB
• Volume: 25
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(85)90537-2