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Approach to the analysis of gate oxide shorts in CMOS digital circuits

✍ Scribed by Jaume A. Segura; Joan Figueras; Antonio Rubio

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 630 KB
Volume: 32
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(92)90448-t

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