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Applying Bayesian mixtures-of-experts models to statistical description of smart power semiconductor reliability

✍ Scribed by Olivia Bluder; Michael Glavanovics; Jürgen Pilz


Book ID
113800511
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
803 KB
Volume
51
Category
Article
ISSN
0026-2714

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