โ Scribed by Bharat Bhushan, Robert A. Sayer (auth.), Bharat Bhushan, Masahiko Tomitori, Harald Fuchs (eds.)
No coin nor oath required. For personal study only.
The success of the Springer Series Applied Scanning Probe Methods IโVII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures, technical polymers, and near eld optics.
Front Matter....Pages I-LIX
Gecko Feet: Natural Attachment Systems for Smart Adhesion-Mechanism, Modeling, and Development of Bio-Inspired Materials....Pages 1-61
Carrier Transport in Advanced Semiconductor Materials....Pages 63-103
Visualization of Fixed Charges Stored in Condensed Matter and Its Application to Memory Technology....Pages 105-130
Applications of Scanning Probe Methods in Chemical Mechanical Planarization....Pages 131-151
Scanning Probe Microscope Application for Single Molecules in a ฯ-Conjugated Polymer Toward Molecular Devices Based on Polymer Chemistry....Pages 153-182
Scanning Probe Microscopy on Polymer Solar Cells....Pages 183-215
Scanning Probe Anodization for Nanopatterning....Pages 217-255
Tissue Engineering: Nanoscale Contacts in Cell Adhesion to Substrates....Pages 257-283
Scanning Probe Microscopy in Biological Research....Pages 285-308
Novel Nanoindentation Techniques and Their Applications....Pages 309-345
Applications to Nano-Dispersion Macromolecule Material Evaluation in an Electrophotographic Printer....Pages 347-358
Automated AFM as an Industrial Process Metrology Tool for Nanoelectronic Manufacturing....Pages 359-412
Scanning Probe Microscope Application for Single Molecules in a ฯ-Conjugated Polymer Toward Molecular Devices Based on Polymer Chemistry....Pages e1-e1
Back Matter....Pages 413-427
Nanotechnology; Surfaces and Interfaces, Thin Films; Polymer Sciences; Physical Chemistry; Solid State Physics and Spectroscopy
๐ SIMILAR VOLUMES
<p>The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. IโIV that a large number of technical and applicational asp
<p>The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. IโIV that a large number of technical and applicational asp
<p><P>The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast t
<p><P>From the reviews:</P><P></P><P>"The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. โฆ As is usually the case with Springer books, these volumes have been beautifully printed